Amorphous SiC resistive memory with embedded Cu nanoparticles
نویسندگان
چکیده
منابع مشابه
Resistive memories using Cu nanoparticles embedded amorphous SiC
Resistive memories (RMs) have simple Metal/Insulator/Metal structures and are considered as outstanding candidates for future non-volatile memory applications [1]. The write and erase of RMs are based on the formation and rupture of conductive filament (CF) in the insulating medium, induced by applying a programming voltage on the device. The formation and rupture of CF switch the device betwee...
متن کاملMicrostructure and electrical properties of co-sputtered Cu embedded amorphous SiC
The properties of co-sputtered Cu embedded amorphous SiC were studied. The effect of the microstructure features on the electrical conduction of the SiC films, with Cu volume% between 0% and 57%, was analysed by temperature dependent measurements, along with an effective-medium approximation model. The electrical conduction in Cu embedded amorphous SiC, was attributed to the tunnelling mechanis...
متن کاملNonvolatile resistive switching memory based on amorphous carbon
Resistive memory effect has been found in carbon nanostructure-based devices by Standley et al. Nano Lett. 8, 3345 2008 . Compared to nanostructures, hydrogenated amorphous carbon a-C:H has much more controllable preparation processes. Study on a-C:H-based memory is of great significance to applications of carbon-based electronic devices. We observed nonvolatile resistance memory behaviors in m...
متن کاملStability, bistability and instability of amorphous ZrO2 resistive memory devices
Amorphous zirconium oxide thin films deposited at room temperature, sandwiched between Pt and Ti electrodes, show resistive bipolar resistive switching with good overall performance figures (retention, ON/OFF ratio and durability). A variability observed during electrical characterisation is consistent with the coexistence of two different resistive switching mechanisms within the ZrO2 layer. E...
متن کاملVisibility of Si nanoparticles embedded in an amorphous SiO2 matrix.
The visibility of a Si crystalline nanoparticle of diameter 2 nm embedded in an amorphous SiO(2) layer is evaluated quantitatively by multislice calculation. The visibility depends on the crystal orientation of the Si nanoparticle, the thickness of the amorphous SiO(2) layer and the defocus. Scherzer defocus always gives the highest visibility at any crystal orientation. The visibility is highe...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microelectronic Engineering
سال: 2017
ISSN: 0167-9317
DOI: 10.1016/j.mee.2016.12.005